DocumentCode :
766406
Title :
Thickness Dependence of Induced Magnetic Anisotropy in Evaporated Permalloy Films
Author :
Goto, M. ; Tange, H. ; Kamimori, T.
Author_Institution :
Faculty of Science, Ehime University, Matsuyama.
Volume :
1
Issue :
7
fYear :
1985
Firstpage :
821
Lastpage :
822
Abstract :
The uniaxial magnetic anisotropy (Ku) of evaporated Permalloy films of different thicknesses was measured. For thinner films, measurements relied on the magnetoresistive (¿R) effect. Although there was considerable scattering in the results, Ku tended to decrease as films were made thinner than 500 Å, and disappeared at around 100 to 300 Å. This decrease is thought to be related to the island structure of extremely thin films, in which case the anisotropy finally disappears in fine crystal grains of size arotund 100 Å.
Keywords :
Anisotropic magnetoresistance; Electrical resistance measurement; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetization; Optical films; Scattering; Substrates; Thickness measurement;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1985.4548975
Filename :
4548975
Link To Document :
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