• DocumentCode
    766406
  • Title

    Thickness Dependence of Induced Magnetic Anisotropy in Evaporated Permalloy Films

  • Author

    Goto, M. ; Tange, H. ; Kamimori, T.

  • Author_Institution
    Faculty of Science, Ehime University, Matsuyama.
  • Volume
    1
  • Issue
    7
  • fYear
    1985
  • Firstpage
    821
  • Lastpage
    822
  • Abstract
    The uniaxial magnetic anisotropy (Ku) of evaporated Permalloy films of different thicknesses was measured. For thinner films, measurements relied on the magnetoresistive (¿R) effect. Although there was considerable scattering in the results, Ku tended to decrease as films were made thinner than 500 Å, and disappeared at around 100 to 300 Å. This decrease is thought to be related to the island structure of extremely thin films, in which case the anisotropy finally disappears in fine crystal grains of size arotund 100 Å.
  • Keywords
    Anisotropic magnetoresistance; Electrical resistance measurement; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetization; Optical films; Scattering; Substrates; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1985.4548975
  • Filename
    4548975