DocumentCode
766406
Title
Thickness Dependence of Induced Magnetic Anisotropy in Evaporated Permalloy Films
Author
Goto, M. ; Tange, H. ; Kamimori, T.
Author_Institution
Faculty of Science, Ehime University, Matsuyama.
Volume
1
Issue
7
fYear
1985
Firstpage
821
Lastpage
822
Abstract
The uniaxial magnetic anisotropy (Ku ) of evaporated Permalloy films of different thicknesses was measured. For thinner films, measurements relied on the magnetoresistive (¿R) effect. Although there was considerable scattering in the results, Ku tended to decrease as films were made thinner than 500 Ã
, and disappeared at around 100 to 300 Ã
. This decrease is thought to be related to the island structure of extremely thin films, in which case the anisotropy finally disappears in fine crystal grains of size arotund 100 Ã
.
Keywords
Anisotropic magnetoresistance; Electrical resistance measurement; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetization; Optical films; Scattering; Substrates; Thickness measurement;
fLanguage
English
Journal_Title
Magnetics in Japan, IEEE Translation Journal on
Publisher
ieee
ISSN
0882-4959
Type
jour
DOI
10.1109/TJMJ.1985.4548975
Filename
4548975
Link To Document