• DocumentCode
    766591
  • Title

    Investigation of DC precise voltage source for use as Zener transport standard

  • Author

    Karpov, O.V. ; Kutovoy, V.D. ; Gumenuk, V.S. ; Shulga, V.M. ; Shakizgyama, F.R. ; Sarandi, A.E.

  • Author_Institution
    NPO VNIIFTRI, Moscow, Russia
  • Volume
    44
  • Issue
    2
  • fYear
    1995
  • fDate
    4/1/1995 12:00:00 AM
  • Firstpage
    204
  • Lastpage
    207
  • Abstract
    Twenty precise compact DC voltages sources based on 6.4-V Zener diodes have been manufactured and investigated by the NPO VNIIFTRI measuring system during the year. Eight sources with voltage drift of less than 8 ppm/year and different drift signs as well as with noise levels lower than 100 nV in the 0.01-10 Hz frequency band have been selected. These sources were used for manufacturing two four-channel reference standards. One standard has been investigated by the Russian 1-V Josephson systems, and another one was examined at the NPO VNIIFTRI. The output voltage drift of the standard sources both under laboratory conditions and during transportation exhibits a linear time dependence. The spread of experimental points with respect to a linear extrapolation did not exceed 2·10-7. The drift value of the best channel was less 0.5 ppm/year
  • Keywords
    Zener diodes; measurement standards; power supply circuits; reference circuits; superconducting device testing; voltage measurement; 0.01 to 10 Hz; 6.4 V; DC precise voltage source; NPO VNIIFTRI measuring system; Russian 1-V Josephson systems; Zener diodes; Zener transport standard; drift signs; four-channel reference standards; laboratory conditions; linear extrapolation; linear time dependence; output voltage drift; standard sources; transportation; voltage drift; Artificial intelligence; Circuits; Diodes; Manufacturing; Noise level; Operational amplifiers; Resistors; Temperature sensors; Thermostats; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.377811
  • Filename
    377811