DocumentCode
766623
Title
U.S. intercomparison of Josephson array voltage standards
Author
Rodriguez, Kathleen M. ; Huntley, Les
Author_Institution
Eastman Kodak Co., Rochester, NY, USA
Volume
44
Issue
2
fYear
1995
fDate
4/1/1995 12:00:00 AM
Firstpage
215
Lastpage
218
Abstract
In the Summer and Fall of 1993, ten laboratories participated in an intercomparison of their 10 V Josephson array standards. The transfer standards were circulated in a “daisy” pattern to minimize the time difference between the pivot laboratory and participant laboratories, thus minimizing the effect of long-term transfer standard noise. The results were encouraging. With the assumption of a group mean equal to 10 V exactly, all laboratories were within 25 ppb of the group mean. Errors this small are more than adequate for supporting any existing equipment. Further analysis of data shows very small systematic errors, most likely caused by thermal emfs generated by above ambient temperatures on the transfer standard output connectors. We describe the experiment, present the results, and discuss implications for future round robins and laboratory proficiency testing
Keywords
calibration; measurement standards; superconducting device testing; voltage measurement; 10 V; Josephson array voltage standards; U.S. intercomparison; daisy pattern; errors; laboratory proficiency testing; long-term transfer standard noise; participant laboratories; pivot laboratory; round robins; systematic errors; thermal emfs; time difference; transfer standards; Data analysis; Instruments; Laboratories; Measurement standards; NIST; Noise measurement; Particle measurements; Testing; Uncertainty; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.377814
Filename
377814
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