• DocumentCode
    766623
  • Title

    U.S. intercomparison of Josephson array voltage standards

  • Author

    Rodriguez, Kathleen M. ; Huntley, Les

  • Author_Institution
    Eastman Kodak Co., Rochester, NY, USA
  • Volume
    44
  • Issue
    2
  • fYear
    1995
  • fDate
    4/1/1995 12:00:00 AM
  • Firstpage
    215
  • Lastpage
    218
  • Abstract
    In the Summer and Fall of 1993, ten laboratories participated in an intercomparison of their 10 V Josephson array standards. The transfer standards were circulated in a “daisy” pattern to minimize the time difference between the pivot laboratory and participant laboratories, thus minimizing the effect of long-term transfer standard noise. The results were encouraging. With the assumption of a group mean equal to 10 V exactly, all laboratories were within 25 ppb of the group mean. Errors this small are more than adequate for supporting any existing equipment. Further analysis of data shows very small systematic errors, most likely caused by thermal emfs generated by above ambient temperatures on the transfer standard output connectors. We describe the experiment, present the results, and discuss implications for future round robins and laboratory proficiency testing
  • Keywords
    calibration; measurement standards; superconducting device testing; voltage measurement; 10 V; Josephson array voltage standards; U.S. intercomparison; daisy pattern; errors; laboratory proficiency testing; long-term transfer standard noise; participant laboratories; pivot laboratory; round robins; systematic errors; thermal emfs; time difference; transfer standards; Data analysis; Instruments; Laboratories; Measurement standards; NIST; Noise measurement; Particle measurements; Testing; Uncertainty; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.377814
  • Filename
    377814