DocumentCode
766638
Title
Characterization of electrostatically coupled microcantilevers
Author
Napoli, Mariateresa ; Zhang, Wenhua ; Turner, Kimberly ; Bamieh, Bassam
Author_Institution
Dept. of Mech. Eng., Univ. of California, Santa Barbara, CA, USA
Volume
14
Issue
2
fYear
2005
fDate
4/1/2005 12:00:00 AM
Firstpage
295
Lastpage
304
Abstract
The use of tightly packed arrays of probes can achieve the much desirable goal of increasing the throughput of scanning probe devices. However the proximity of the probes induces coupling in their dynamics, which increases the complexity of the overall device. In this paper we analyze and model the behavior of a pair of electrostatically and mechanically coupled microcantilevers. For the common case of periodic driving voltage, we show that the underlying linearized dynamics are governed by a pair of coupled Mathieu equations. We provide experimental evidence that confirms the validity of the mathematical model proposed, which is verified by finite element simulations as well. The coefficients of electrostatic and mechanical coupling are estimated respectively by frequency identification methods and noise analysis. Finally, we discuss parametric resonance for coupled oscillators and include a mapping of the first order coupled parametric resonance region.
Keywords
finite element analysis; microactuators; oscillators; scanning probe microscopy; coupled Mathieu equations; coupled oscillators; device complexity; electrostatic coupling; electrostatically actuation; electrostatically coupled microcantilevers; finite element simulation; frequency identification method; linearized dynamics; mechanical coupling; mechanically coupled microcantilevers; multiprobe devices; noise analysis; parametric resonance region; probe arrays; scanning probe devices; system identification; Coupled mode analysis; Electrostatic analysis; Equations; Finite element methods; Frequency estimation; Mathematical model; Probes; Resonance; Throughput; Voltage; Electrostatically actuated microcantilevers; multiprobe devices; parametric resonance; system identification;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2004.839349
Filename
1416906
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