• DocumentCode
    766651
  • Title

    Comparisons of 10-V Josephson array voltage standards between the BNM/LCIE and the BIPM

  • Author

    Lo-Hive, J.P. ; Reymann, D. ; Genevès, G.

  • Author_Institution
    BNM/LCIE, Fintenay-aux-Roses, France
  • Volume
    44
  • Issue
    2
  • fYear
    1995
  • fDate
    4/1/1995 12:00:00 AM
  • Firstpage
    230
  • Lastpage
    233
  • Abstract
    A comparison of the 10 V Josephson array voltage standards of the BNM/LCIE and of the BIPM has been carried out. An indirect comparison using Zener-diode based voltage references as transfer standards shows an agreement of 5 parts in 109 with an uncertainty (1σ) of the same value. On-site indirect and direct comparisons show no difference between the two standards within the total uncertainty of 1.2 parts in 1010
  • Keywords
    measurement standards; superconducting device testing; voltage measurement; 10 V; BIPM; BNM/LCIE; Josephson array voltage standards; Zener-diode; indirect comparison; onsite direct comparisons; onsite indirect comparisons; transfer standards; uncertainty; voltage references; Battery charge measurement; Counting circuits; Detectors; Dielectric losses; Laboratories; NIST; Niobium; Uncertainty; Video recording; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.377818
  • Filename
    377818
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=766651