DocumentCode :
766727
Title :
Surface potential distributions due to eddy currents around long cracks in metals, induced by U-shaped current-carrying wires
Author :
Sadeghi, S.H.H. ; Syahkal, D. Mirshekar
Author_Institution :
Dept. of Electron. Syst. Eng., Essex Univ., Colchester, UK
Volume :
27
Issue :
1
fYear :
1991
fDate :
1/1/1991 12:00:00 AM
Firstpage :
674
Lastpage :
679
Abstract :
Sizing of surface-breaking cracks in metals by the AC field measurement (ACFM) technique by producing the surface field by inducing current into the specimen under test is considered. The surface potential distribution produced by an inducing mechanism around a long crack in a ferrous metal is formulated, and the crack signal, which is the variation of the potential difference around the crack, is investigated by varying the crack depth, the dimensions of the inducer, and the inducer´s lift-off distance from the metal surface. The inducer consists of two parallel U-shaped wires symmetrically attached to the two sides of an ACFM probe. It is shown that the direct application of the one-dimensional formula based on the uniform field assumption for the interpretation of the crack signal gives rise to an underestimation of the crack depth. However, it is shown that the error in depth measurement by this formula can be negligible if the horizontal sections of the inducer´s wires are sufficiently long
Keywords :
crack detection; eddy current testing; surface potential; AC field measurement technique; NDT; U-shaped current-carrying wires; crack depth; crack detection; crack signal; crack sizing; eddy current probe; eddy currents; long cracks; metals; one-dimensional formula; potential difference; surface potential distributions; surface unfolding technique; surface-breaking cracks; uniform field assumption; Cables; Current measurement; Eddy currents; Inspection; Probes; Size measurement; Steel; Surface cracks; Testing; Wires;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.101116
Filename :
101116
Link To Document :
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