Title :
Reflectometer calibration using planar NiCr thin-film resistors and an open circuit
Author_Institution :
Physikalisch Tech. Bundesanstalt, Braunschweig, Germany
fDate :
4/1/1995 12:00:00 AM
Abstract :
A method for determining the three error-box parameters of complex reflectometers is reported. A set of planar NiCr thin-film resistors mounted in identical coaxial connectors and only an open circuit are used. A comparison of reflection measurements obtained with the new method with measurements obtained using the “quarter wavelength” technique shows good agreement between results in the megahertz range
Keywords :
calibration; chromium alloys; electric resistance measurement; measurement standards; nickel alloys; reflectometers; thin film resistors; MHz range; NiCr; NiCr thin-film resistors; complex reflectometers; identical coaxial connectors; open circuit; quarter wavelength technique; reflection measurements; reflectometer calibration; three error-box parameters; Admittance; Calibration; Coaxial components; Connectors; Equations; Measurement standards; Reflection; Resistors; Thin film circuits; Wavelength measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
