• DocumentCode
    766888
  • Title

    Numerical Simulation Study of Magnetization Precession Dynamics in Submicrometer Elliptical Ni _80 Fe _20 Thin-Film Elements

  • Author

    Choi, B.C. ; Xiao, Q.F. ; Hong, Y.K. ; Gee, S.H. ; Jabal, J. ; Han, H. ; Hass, K.J. ; Donohoe, G.W.

  • Author_Institution
    Dept. of Phys. & Astron., Victoria Univ.
  • Volume
    42
  • Issue
    10
  • fYear
    2006
  • Firstpage
    3216
  • Lastpage
    3218
  • Abstract
    Nonequilibrium magnetization configuration and magnetic switching behavior are studied using micromagnetic modeling. In particular, it is found that coherent rotation and magnetization ringing in submicrometer Ni80Fe20 elements can be controlled by adjusting the axis-ratio of the ellipse, the thickness, and the angle of the magnetic field pulse with respect to the axis of elliptical elements. For the element with 400-nm-long axis, 200-nm-short axis, and 4.7-nm thickness, the nonuniform distribution of magnetization results from a strong in-plane, nonuniform demagnetization field during magnetization precession. The simulation results indicate that uniformity in the distribution of the magnetization during reversal is improved by reducing the length of the short axis from 200 nm to 112 nm, and reducing the thickness of the thin film from 4.7 to 3.2 nm. The modification in the geometric configuration of the element is found to effectively suppress the magnetization ringing
  • Keywords
    iron alloys; magnetic switching; magnetic thin films; magnetisation; micromagnetics; nickel alloys; spin dynamics; Ni80Fe20; elliptical elements; magnetic domains; magnetic switching; magnetization dynamics; magnetization precession dynamics; magnetization reversal; magnetization ringing supression; micromagnetic modeling; nonequilibrium magnetization; nonuniform demagnetization field; submicrometer elliptical thin-film; Equations; Iron; Magnetic domain walls; Magnetic domains; Magnetic switching; Magnetization reversal; Micromagnetics; Numerical simulation; Saturation magnetization; Transistors; Magnetic domains; magnetization dynamics; magnetization reversal; micromagnetic modeling;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2006.880105
  • Filename
    1704578