• DocumentCode
    766891
  • Title

    Automated calibration methods for a high-voltage Park divider

  • Author

    Su, Tsung-han ; Chen, I-Pao ; Tsao, S. Hoi

  • Author_Institution
    Nat. Meas. Lab., Hsinchu, Taiwan
  • Volume
    44
  • Issue
    2
  • fYear
    1995
  • fDate
    4/1/1995 12:00:00 AM
  • Firstpage
    318
  • Lastpage
    321
  • Abstract
    Two new methods of calibrating the 1/10 voltage ratio of a 100-kV Park divider, which has been provided with a set of tenths ratio taps is described. The proposed methods make PC-controlled measurements based on (1) Wheatstone bridge circuits configurable entirely with the resistive sections of the tapped divider, and (2) a digital conductance comparator, respectively. The 1/10 ratio measurements made by these quite different methods were found to be consistent to 3 ppm of the ratio. The conductance comparison method, with an assessed standard uncertainty of 2 ppm, determined precisely the effect of self-heating on the measured ratio, minute-by-minute after the rated input was applied. Subdividing the established 1/10 ratio to 1/100 and 1/105 of input, however, is based on more conventional methods. These subdivided ratios have been given a standard uncertainty not exceeding 6 ppm in the absence of corona discharge
  • Keywords
    bridge circuits; calibration; comparators (circuits); high-voltage techniques; measurement standards; microcomputer applications; voltage dividers; voltage measurement; 1/10 ratio measurements; 1/10 voltage ratio; 100 kV; HV Park divider; PC-controlled measurements; Wheatstone bridge circuits; automated calibration; conductance comparison; corona discharge; digital conductance comparator; measured ratio; resistive sections; self-heating; standard uncertainty; tapped divider; Bridge circuits; Calibration; Corona; Digital relays; Elbow; Fasteners; Laboratories; Measurement standards; Power supplies; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.377841
  • Filename
    377841