DocumentCode :
766947
Title :
Microstructure and Its Growth Mechanism in Sputtered Co-Cr Films
Author :
Niimura, Y. ; Naoe, M.
Author_Institution :
Tokyo Institute of Technology.
Volume :
1
Issue :
8
fYear :
1985
Firstpage :
954
Lastpage :
955
Abstract :
The two facing targets sputtering technique is used to fabricate Co-Cr films in order to investigate the relations between the microstructure and Cr segregation and the variation in magnetic properties by analyzing the growth mechanism. It was found that the samples formed under high PAr had Hc¿ and Hcu values 30-50 percent higher than films formed in the medium PAr range (0.4-10 mTorr). This seems to be due to the fact that the individual columnar particles forming these films are magnetically isolated and independent.
Keywords :
Chromium; Glass; Magnetic films; Magnetic properties; Magnetics Society; Microstructure; Polyimides; Semiconductor films; Sputtering; Tellurium;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1985.4549026
Filename :
4549026
Link To Document :
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