Structures and Properties of Double-Layer Perpendicular Rigid Disks

The properties of RF sputtered double-layer CoCr films for perpendicular magnetic recording disks were investigated. The films were formed on two different types of alumite substrate layer coated with an Ni-P surface-processed layer and a high-permeability layer between the substrate and the CoCr films. Finally, Ti layers of various thicknesses were inserted between the high-permeability layer and the CoCr film. Hc¿ increased with substrate temperature, and it was concluded that this was due to the fact that the substrate coating affected the CoCr film microstructure.