Thickness Dependence of Magnetic Properties in CoCr Film by High-Rate Evaporation

The relation between film thickness and magnetic properties of CoCr films prepared by the high-rate evaporation techinique which is well suited to mass production, as well as the film growth process itself, were investigated. CoCr films were deposited with a web-coater type vacuum evaporation system. The crystallographic orientation of the films becomes stable during initial layer formation process (¿ 0.02 ¿m), but Hc¿ continues to decrease with the increase of film thickness above 0,05 ¿m. This corresponds to changes of the film microstructure.