Subwavelength slotted corrugated plate with enhanced quasioptical millimeter wave transmission

Author

Beruete, M. ; Sorolla, M. ; Campillo, I. ; Dolado, J.S.

Author_Institution

Dept. de Ingenieria Eectrica y Electron., Univ. Publica de Navarra, Pamplona, Spain

Volume

15

Issue

4

fYear

2005

fDate

4/1/2005 12:00:00 AM

Firstpage

286

Lastpage

288

Abstract

Enhanced millimeter wave transmission through a subwavelength slot placed into a corrugated conducting wafer, using perfect conductor model, is experimentally observed compared with the case of the single isolated slot. The corrugated wafer responds in a similar way as in the optical regime, in which a surface plasmon model is employed to describe the metal. Experimental results of the enhanced transmission and reflection of the corrugated wafer have been measured by using a quasioptical vector network analyzer. Future applications of enhanced subwavelength transmission in quasioptical devices are envisaged.

Keywords

electromagnetic wave transmission; metamaterials; conducting wafer; conductor model; corrugated wafer; metamaterials; quasioptical devices; quasioptical millimeter wave transmission; quasioptical vector network analyzer; subwavelength slot; subwavelength transmission; surface plasmon model; Corrugated surfaces; Metamaterials; Millimeter wave technology; Optical arrays; Optical films; Optical surface waves; Optical waveguides; Plasmons; Resonance; Semiconductor device modeling; Corrugated wafer; extraordinary transmission; metamaterials; quasioptics; subwavelength;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2005.845753

Filename

1416956