DocumentCode
76737
Title
Numerical Investigation on
Measurement and Defect Detection by Inductive/Permanent-Magnet Methods
Author
Takayama, Teruou ; Ikuno, Soichiro ; Kamitani, Atsushi ; Hattori, K. ; Saito, Akihiro ; Ohshima, Shigetoshi
Author_Institution
Dept. of Inf., Yamagata Univ., Yamagata, Japan
Volume
23
Issue
3
fYear
2013
fDate
Jun-13
Firstpage
9001107
Lastpage
9001107
Abstract
The applicability of the inductive method or the scanning permanent magnet method to the crack detection in a high-temperature superconducting (HTS) film is investigated by means of numerical simulation. To this end, a numerical method is proposed for calculating the shielding current density in an HTS containing a crack. In the method, the integral form of Faraday´s law is forced to be numerically satisfied by applying the virtual voltage along the crack surface. A numerical code is developed on the basis of the proposed method and the influence of a crack on both methods is numerically investigated. The results of computations show that, in the inductive method, the crack position can be roughly detected from the accuracy degradation of the estimated critical current density. On the other hand, in the scanning permanent magnet method, it can be determined more accurately by scanning an HTS film in two opposite directions.
Keywords
crack detection; critical current density (superconductivity); high-temperature superconductors; numerical analysis; permanent magnets; superconducting thin films; surface cracks; Faraday law; crack detection; crack surface; critical current density; defect detection; high-temperature superconducting film; inductive method; numerical code; numerical simulation; scanning permanent magnet method; shielding current density; Accuracy; Boundary conditions; Coils; Current density; High temperature superconductors; Magnetic noise; Permanent magnets; Critical current density; Newton method; high-temperature superconductors; integrodifferential equations;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2013.2248872
Filename
6472279
Link To Document