• DocumentCode
    767638
  • Title

    Computer-aided design of a BPSK spread-spectrum chip set

  • Author

    Jain, Rajeev ; Samueli, Henry ; Yang, Paul T. ; Chien, Charles ; Chen, Gloria G. ; Lau, Linda K. ; Chung, Bong-Young ; Cohen, Etan G.

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    27
  • Issue
    1
  • fYear
    1992
  • fDate
    1/1/1992 12:00:00 AM
  • Firstpage
    44
  • Lastpage
    58
  • Abstract
    The design of a binary-phase shift-keyed (BPSK) spread-spectrum chip set with an integrated CAD environment called VANDA is described. VANDA uses the functional compiler concept to integrate system and physical designs, thus allowing complex high-performance integrated circuit chips to be implemented easily. Three functional compilers have been designed and implemented for the design of a spread-spectrum transceiver: a pseudonoise (PN) generator compiler, a direct digital frequency synthesizer (DDFS) compiler, and a Costas loop compiler. Three test chips for a BPSK digital intermediate frequency (IF) spread-spectrum system generated by these compilers have been fabricated and tested. Details of each of the functional compilers and the test chips are described. In addition, the measurement results for digital IF transceiver test boards constructed using these chips are presented
  • Keywords
    CMOS integrated circuits; circuit layout CAD; frequency synthesizers; noise generators; phase shift keying; spread spectrum communication; transceivers; BPSK; Costas loop; VANDA; binary-phase shift keying; digital IF transceiver test boards; direct digital frequency synthesizer; functional compilers; integrated CAD environment; layout CAD; physical designs; pseudonoise generator; silicon compilers; spread-spectrum chip set; spread-spectrum transceiver; system design; test chips; Baseband; Binary phase shift keying; CMOS analog integrated circuits; CMOS process; Circuit testing; Design automation; Frequency synthesizers; Radio frequency; Semiconductor device measurement; Spread spectrum communication; System testing; Transceivers;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.109556
  • Filename
    109556