DocumentCode :
767817
Title :
Modeling and verification of FEC performance for optical transmission systems using a proposed uniformly quantized symbol error probability model
Author :
Choi, Eoiyoung ; Jang, Hodeok ; Lee, Jaehoon ; Lee, Hanlim ; Hwang, Seongtaek ; Oh, Yun-Je ; Lee, Inkyu ; Jeong, Jichai
Author_Institution :
Dept. of Radio Eng., Korea Univ., Seoul, South Korea
Volume :
23
Issue :
3
fYear :
2005
fDate :
3/1/2005 12:00:00 AM
Firstpage :
1100
Lastpage :
1104
Abstract :
We investigate the estimation of the bit-error rate (BER) performance of optical transmission systems with forward error correction (FEC) coding using a proposed uniformly quantized symbol error probability model. This model has been verified by the measurement of BER characteristics of coded and uncoded 10 Gb/s optical signals transmitted over 100 km. The measured results are very similar to the calculated results from the proposed model as well as Monte Carlo (MC) simulations. Our results suggest that the proposed uniformly quantized symbol error probability model using more than 8-decision levels can be applied to estimate BER performance for coded systems without degrading accuracy.
Keywords :
Monte Carlo methods; Reed-Solomon codes; error statistics; forward error correction; optical fibre communication; 10 Gbit/s; 100 km; 8-decision levels; FEC performance modeling; FEC performance verification; Monte Carlo simulations; Reed-Solomon code; bit-error rat performance estimation; coded optical signals; coded systems; forward error correction coding; optical signal transmission; optical transmission systems; uncoded optical signals; uniformly quantized symbol error probability model; Associate members; Bit error rate; Decoding; Error correction codes; Error probability; Forward error correction; Monte Carlo methods; Optical fibers; Optical noise; Research and development; Bit-error rate (BER) performance; Reed–Solomon code; coded systems; forward error correction (FEC); optical transmission systems; uniformly quantized symbol error probability model;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2005.843452
Filename :
1417005
Link To Document :
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