• DocumentCode
    76799
  • Title

    Semi-Analytic Solution to Forward Scattering From a Long Conductive Strip

  • Author

    Musselman, Randall L. ; Norgard, John D.

  • Author_Institution
    U.S. Air Force Acad., Colorado Springs, CO, USA
  • Volume
    62
  • Issue
    7
  • fYear
    2014
  • fDate
    Jul-14
  • Firstpage
    3702
  • Lastpage
    3713
  • Abstract
    A semi-analytic model is developed that accurately describes the scattered electromagnetic field (including both reflection and diffraction) from a long conductive strip, which is on the order of a wavelength wide. When the dimension of this conductor is on the order of a wavelength, the gross approximations used for ray-tracing models cannot be used, because the scattering object does not satisfy the assumption that it is electrically large, resulting in a vanishing wavelength. Unlike ray-tracing techniques, this model completely describes the field diffracted around and behind the conductive obstruction, creating the null that is commonly called the “shadow” from an illuminated object. The only assumption made is that the strip is relatively long, compared to its width and to the wavelength. When simulations from this analytic model are compared to simulations from an established numerical model, it is found that this analytic model provides accuracy comparable to numeric methods, without the extensive computational intensity involved in numerical solutions. Furthermore, simulated field patterns from this analytic diffraction model are compared to 2-D measured patterns, resulting in close agreement.
  • Keywords
    electromagnetic wave scattering; numerical analysis; ray tracing; 2D measured pattern; electromagnetic field diffraction; electromagnetic field reflection; electromagnetic field scattering; long conductive strip; numerical model; object illumination; ray-tracing model; semianalytic solution model; Apertures; Electric fields; Magnetic resonance imaging; Numerical models; Scattering; Strips; Vectors; Babinet´s principle; Huygen´s sources; diffraction; electromagnetic scattering; wave propagation;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2014.2317473
  • Filename
    6797878