A least-squares approach to analyzing life-stress relationship in step-stress accelerated life tests

Author

Teng, Siew-Leng ; Yeo, Kwee-Poo

Author_Institution

Blk 151, Singapore, Singapore

Volume

51

Issue

2

fYear

2002

fDate

6/1/2002 12:00:00 AM

Firstpage

177

Lastpage

182

Abstract

A new approach is proposed for the data analysis of failure-censored step-stress accelerated life tests with exponential failures, following an assumed log-linear life-stress relationship. This approach, transformed least squares: (1) provides closed-form parameter estimates; (2) motivates a simple statistic for life-stress relationship verification; and (3) appreciably simplifies the derivation of optimal test plans. The proposed D-statistic has good power and compares reasonably well with likelihood-ratio test statistic. Estimates are unbiased and exact for failure-step tests of any sample size. The derived optimal test plans agree with those derived using maximum likelihood estimation

Keywords

least squares approximations; life testing; maximum likelihood estimation; stress analysis; D-statistic; closed-form parameter estimates; data analysis; exponential failures; failure-censored step-stress accelerated life tests; failure-step tests; least squares estimation method; least-squares approach; life-stress relationship analysis; life-stress relationship verification; likelihood-ratio test statistic; log-linear life-stress relationship; maximum likelihood estimation; optimal test plans; step-stress accelerated life tests; transformed least squares; Data analysis; Exponential distribution; Least squares approximation; Life estimation; Life testing; Maximum likelihood estimation; Parameter estimation; Statistical analysis; Statistical distributions; Stress;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/TR.2002.1011523

Filename

1011523