DocumentCode :
768102
Title :
Calculation of losses in micro-ring resonators with arbitrary refractive index or shape profile and its applications
Author :
Rabiei, Payam
Author_Institution :
Nonlinear Opt. Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland
Volume :
23
Issue :
3
fYear :
2005
fDate :
3/1/2005 12:00:00 AM
Firstpage :
1295
Lastpage :
1301
Abstract :
A perturbative approach is discussed for the calculation of the radiation and scattering losses in cylindrical microresonators with arbitrary refractive index or shape profile. A new method for inducing losses in the cavity using the electrooptic effect with periodic modulation of the refractive index is introduced. The perturbative method is used for the calculation of the losses due to periodic modulation of the refractive index. The applications of this approach for the calculation of scattering losses due to surface roughness of microresonators and scattering due to deviation from ideal cylindrical shape are discussed.
Keywords :
electro-optical effects; light scattering; micro-optics; optical losses; optical modulation; optical resonators; optical tuning; perturbation techniques; refractive index; surface roughness; electrooptic effect; microring resonators; periodic modulation; perturbative approach; refractive index; scattering losses; shape profile; surface roughness; Electrooptic effects; Microcavities; Optical filters; Optical losses; Optical modulation; Optical resonators; Optical scattering; Optical switches; Refractive index; Shape; Electrooptic devices; optical switch; optical waveguides; radiation losses;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2004.841437
Filename :
1417029
Link To Document :
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