• DocumentCode
    768204
  • Title

    Effect of cooling rate on interfacial fatigue-crack growth in Sn-Pb solder joints

  • Author

    Yao, Daping ; Shang, Jim Ku

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    19
  • Issue
    1
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    154
  • Lastpage
    165
  • Abstract
    The effect of the cooling rate after the reflow on the behavior of fatigue crack growth along Cu/Sn-Pb interfaces was examined in solder joints. Flexural peel specimens made from eutectic Sn-Pb solder alloy and Cu were cooled down from reflowing to room temperature using furnace cooling, air cooling, and water quenching. Kinetics of fatigue crack growth along the solder/Cu interface were measured from the flexural peel specimens as a function of strain energy release rate. The effect of cooling rate was found to depend on the level of strain energy release rate. Increasing the cooling rate from furnace cooling to water-quenching enhanced the fatigue crack growth resistance by up to more than 50% at low strain energy release rates, but reduced the fatigue crack growth resistance by up to 100% at high strain energy release rates. The enhanced fatigue crack growth resistance at the low strain energy release rates is shown to result from roughening of the interface with increasing cooling rate, while the reduction in the fatigue crack growth resistance at very high strain energy release rates followed the change in crack growth mechanisms from cohesive to interfacial
  • Keywords
    cooling; copper; fatigue cracks; integrated circuit packaging; interface structure; lead alloys; reflow soldering; thermal stress cracking; tin alloys; Cu-SnPb; Cu/Sn-Pb interfaces; IC chips; Sn-Pb solder joints; air cooling; cohesive mechanism; cooling rate; eutectic Sn-Pb solder alloy; fatigue crack growth kinetics; fatigue crack growth resistance; fatigue threshold; flexural peel specimens; furnace cooling; interface roughening; interfacial fatigue-crack growth; interfacial mechanism; reflow; strain energy release rate; thermal fatigue; water quenching; Capacitive sensors; Cooling; Copper alloys; Electrical resistance measurement; Fatigue; Furnaces; Kinetic theory; Soldering; Strain measurement; Temperature;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.486498
  • Filename
    486498