DocumentCode :
768320
Title :
Temperature and stress time history responses in electronic packaging
Author :
Lau, John H.
Author_Institution :
Express Packaging Syst. Inc., Palo Alto, CA, USA
Volume :
19
Issue :
1
fYear :
1996
fDate :
2/1/1996 12:00:00 AM
Firstpage :
248
Lastpage :
254
Abstract :
The closed-form thermoelasticity solutions of electronic packages subjected to an instantaneous source of heat, and a heat source varying harmonically as function of time, are presented. Useful curves and charts which relate the variables, time, frequency, heat, temperature, stress, displacement, and material property are also provided for engineering practice convenience. Also, the present results can be used to verify finite element analysis procedures and interpret experimental data
Keywords :
deformation; finite element analysis; packaging; thermal analysis; thermal stresses; thermoelasticity; closed-form thermoelasticity solutions; displacement; electronic packaging; finite element analysis; frequency; heat; material property; stress time history response; temperature; time; Electronic packaging thermal management; Electronics packaging; Frequency; History; Poisson equations; Space heating; Temperature distribution; Thermal conductivity; Thermal force; Thermal stresses;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9894
Type :
jour
DOI :
10.1109/96.486509
Filename :
486509
Link To Document :
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