• DocumentCode
    768480
  • Title

    The New World of ESL Design

  • Author

    Kwang-Ting Cheng

  • Volume
    23
  • Issue
    5
  • fYear
    2006
  • fDate
    5/1/2006 12:00:00 AM
  • Firstpage
    333
  • Lastpage
    333
  • Abstract
    This issue of IEEE Design & Test discusses some of the challenges of electronic system-level design and their corresponding solutions. In addition, a special section highlights the 2006 International Test Conference.
  • Keywords
    ESL; electronic system-level design; Electronic equipment testing; System testing; System-level design; ESL; electronic system-level design;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2006.135
  • Filename
    1704722
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=768480