Title :
The New World of ESL Design
Author :
Kwang-Ting Cheng
fDate :
5/1/2006 12:00:00 AM
Abstract :
This issue of IEEE Design & Test discusses some of the challenges of electronic system-level design and their corresponding solutions. In addition, a special section highlights the 2006 International Test Conference.
Keywords :
ESL; electronic system-level design; Electronic equipment testing; System testing; System-level design; ESL; electronic system-level design;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2006.135
