Title :
A comparison by simulation and by measurement of the substrate noise generated by CMOS, CSL, and CBL digital circuits
Author :
Albuquerque, Edgar Francisco Monteiro ; Silva, Manuel Medeiros
Author_Institution :
Tech. Univ. of Lisbon, Portugal
fDate :
4/1/2005 12:00:00 AM
Abstract :
Current-steering logic (CSL) and current-balanced logic (CBL) are logic families that have been proposed with the objective of reducing the substrate noise in mixed-signal integrated circuits. These two families are compared here with conventional CMOS by simulation, using a substrate model extracted from the layouts, and also by measurements on a test chip. With small, low-power cells, noise reduction of CSL and CBL with respect to CMOS is only marginal; the same result is obtained with large, high-power (buffer) cells, if the supply wire inductance is very low. For large cells with typical wire bonding supply inductance (of the order of 10 nH), CBL cells provide significant noise reduction and are more effective than CSL cells; these become even noisier than CMOS cells for large inductance values. The results here, considering the real substrate noise, are more reliable than previous evaluations considering only the amplitude of the supply current spikes.
Keywords :
CMOS digital integrated circuits; circuit simulation; integrated circuit measurement; integrated circuit noise; logic testing; mixed analogue-digital integrated circuits; CBL cells; CBL digital circuits; CMOS cells; CMOS digital circuits; CMOS integrated circuits; CSL cells; CSL digital circuits; current-balanced logic; current-steering logic; high-power buffer cells; logic families; low-noise logic; low-power cells; mixed-signal integrated circuits; substrate model; substrate noise measurement; substrate noise reduction; substrate noise simulation; supply wire inductance; test chip measurements; wire bonding supply inductance; CMOS digital integrated circuits; CMOS logic circuits; Circuit noise; Circuit simulation; Digital circuits; Inductance; Logic circuits; Noise generators; Noise measurement; Noise reduction; CMOS integrated circuits; logic families; low-noise logic; mixed-signal integrated circuits; substrate noise;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2005.844110