Title :
Guest Editor´s Introduction: ITC Helps Get More Out of Test
Author :
Butler, Kenneth M.
Author_Institution :
Texas Instruments
fDate :
5/1/2006 12:00:00 AM
Abstract :
This special section, along with the International Test Conference 2006, highlights the value that test adds to the electronics manufacturing business. It leads us to think about test in a whole new way.
Keywords :
International Test Conference; test; Clocks; Companies; Delay; Electronic equipment testing; Instruments; Integrated circuit modeling; Integrated circuit testing; Peer to peer computing; Semiconductor device modeling; Virtual manufacturing; International Test Conference; test;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2006.120
