Title :
A critical analysis on global convergence of Hopfield-type neural networks
Author :
Peng, Jigen ; Xu, Zong-Ben ; Qiao, Hong ; Zhang, Bo
Author_Institution :
Fac. of Sci., Xi´´an Jiaotong Univ., China
fDate :
4/1/2005 12:00:00 AM
Abstract :
This paper deals with the global convergence and stability of the Hopfield-type neural networks under the critical condition that M1(Γ)=L-1DΓ-(ΓW+WTΓ)/(2) is nonnegative for any diagonal matrix Γ, where W is the weight matrix of the network, L=diag{L1,L2,...,LN} with Li being the Lipschitz constant of gi and G(u)=(g1(u1),g2(u2),...,gN(uN))T is the activation mapping of the network. Many stability results have been obtained for the Hopfield-type neural networks in the noncritical case that M1(Γ) is positive definite for some positive definite diagonal matrix Γ. However, very few results are available on the global convergence and stability of the networks in the critical case. In this paper, by exploring two intrinsic features of the activation mapping, two generic global convergence results are established in the critical case for the Hopfield-type neural networks, which extend most of the previously known globally asymptotic stability criteria to the critical case. The results obtained discriminate the critical dynamics of the networks, and can be applied directly to a group of Hopfield-type neural network models. An example has also been presented to demonstrate both theoretical importance and practical significance of the critical results obtained.
Keywords :
Hopfield neural nets; asymptotic stability; matrix algebra; numerical stability; Hopfield-type neural networks; Lipschitz constant; activation mapping; asymptotic stability; critical analysis; diagonal matrix; global convergence; networks stability; stability analysis; Associative memory; Asymptotic stability; Automation; Convergence; Fasteners; Hopfield neural networks; Neural networks; Pattern recognition; Stability analysis; Very large scale integration; Attractive; Hopfield-type neural networks; global convergence; stability analysis;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2005.844366