مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

768650

Title :

Getting More out of ITC

Author :

Gattiker, Anne

Author_Institution :

IBM Austin Research Lab

Volume :

Issue :

fYear :

2006

fDate :

5/1/2006 12:00:00 AM

Firstpage :

432

Lastpage :

432

Abstract :

A look at plans for the 2006 International Test Conference.

Keywords :

International Test Conference; Testing; International Test Conference;

fLanguage :

English

Journal_Title :

Design & Test of Computers, IEEE

Publisher :

ieee

ISSN :

0740-7475

Type :

jour

DOI :

10.1109/MDT.2006.119

Filename :

1704740

Link To Document :