Title :
BER sensitivity of OFDM systems to carrier frequency offset and Wiener phase noise
Author :
Pollet, T. ; Van Bladel, M. ; Moeneclaey, M.
Author_Institution :
Commun. Eng. Lab., Ghent Univ., Belgium
Abstract :
In this contribution the transmission of M-PSK and M-QAM modulated orthogonal frequency division multiplexed (OFDM) signals over an additive white Gaussian noise (AWGN) channel is considered. The degradation of the bit error rate (BER), caused by the presence of carrier frequency offset and carrier phase noise is analytically evaluated. It is shown that for a given BER degradation, the values of the frequency offset and the linewidth of the carrier generator that are allowed for OFDM are orders of magnitude smaller than for single carrier systems carrying the same bit rate.<>
Keywords :
Gaussian channels; error statistics; frequency division multiplexing; phase noise; phase shift keying; quadrature amplitude modulation; stochastic processes; white noise; BER sensitivity; M-PSK; M-QAM; OFDM systems; Wiener phase noise; additive white Gaussian noise channel; bit error rate degradation; carrier frequency offset; carrier generator; carrier phase noise; linewidth; signal transmission; AWGN; Additive white noise; Bit error rate; Bit rate; Degradation; Frequency division multiplexing; Frequency modulation; OFDM modulation; Phase noise;
Journal_Title :
Communications, IEEE Transactions on
