Variation in proton-induced upsets rates from large solar flares using an improved SEU model

Author

Normand, Eugene ; Stapor, William J.

Author_Institution

Boeing Aerosp. & Electron., Seattle, WA, USA

Volume

37

Issue

6

fYear

1990

fDate

12/1/1990 12:00:00 AM

Firstpage

1947

Lastpage

1952

Abstract

Proton integral flux measurements during solar energetic particle (SEP) events, from the CPME instrument onboard the IMP-8 satellite, and the proton detector on the GOES-7 satellite, are utilized to calculate proton-induced single-event upset (SEU). An improved two-parameter SEU cross section model is used for three RAM devices. The log of the 239 actual RAM upsets on the TDRS-1 satellite during the October 19, 1989 SEP event allowed a comparison between the recorded number of upsets/chip per day and those predicted based on the GOES-7 data, the two-parameter model, and the shielding distribution curve

Keywords

aerospace instrumentation; artificial satellites; cosmic ray effects and interactions; cosmic ray protons; integrated memory circuits; proton effects; random-access storage; solar flares; CPME instrument; GOES-7 satellite; IMP-8 satellite; RAM; SEU cross section model; TDRS-1 satellite; large solar flares; proton detector; proton integral flux; proton-induced upsets rates; shielding distribution curve; single-event upset; solar energetic particle events; two-parameter model; Aerospace electronics; Detectors; Energy measurement; Event detection; Extraterrestrial measurements; Instruments; Laboratories; Particle measurements; Protons; Satellites;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.101213

Filename

101213