DocumentCode :
768901
Title :
Swap Gate of the Dual Conductor Current Access Device
Author :
Oshiro, M. ; Takahashi, H. ; Itoh, A. ; Inoue, F. ; Kawanishi, K.
Author_Institution :
Graduate School of Nihon Univ.
Volume :
2
Issue :
3
fYear :
1987
fDate :
3/1/1987 12:00:00 AM
Firstpage :
287
Lastpage :
288
Abstract :
Swap gates were designed for dual conductor current access bubble devices, and their performance investigated using an enlarged model and by computer simulations. The enlarged model experiments were used to measure magnetic field distributions; simulations employed parameters for typical (YBi)3(GaFe)5O12 bubble films. Driving relies on a sequence of currents, with swap gates operated by changing this sequence. The swap gate pattern was gradually improved through repeated testing, and for a driving current density of 1.5 mA/¿m a satisfactory maximum bias margin of 12.3 percent was achieved for operation in all modes.
Keywords :
Computational modeling; Computer simulation; Conductive films; Conductors; Current density; Magnetic field measurement; Magnetic fields; Magnetic films; Material properties; Testing;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1987.4549410
Filename :
4549410
Link To Document :
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