• DocumentCode
    768960
  • Title

    Availability of Al-Mg alloys for use as electrical contact resistors

  • Author

    Kaneko, Noriyoshi ; Honda, Fumihiro ; Nakajima, Koichi

  • Author_Institution
    Yazaki Corp., Shizuoka, Japan
  • Volume
    19
  • Issue
    1
  • fYear
    1996
  • fDate
    3/1/1996 12:00:00 AM
  • Firstpage
    98
  • Lastpage
    104
  • Abstract
    Fretting experiments associated with contact resistance were carried out with Al-Mg alloys (Al-3wt%Mg and Mg-3wt%Al). It was found that the contact behavior of these alloys is considerably different; the saturation value is 2.5 mΩ at a load less than 1N for A-3wt%Mg irrespective of humidity and has almost the same value (3 mΩ) at 2N with a relative humidity under 30%RH for Mg-3wt%Al. The number of cycles at the saturation value of the contact resistance in Mg-Al decreases with increasing humidity. The analysis of the fretted surface with electric current showed that the X-ray diffraction intensity of MgO formed during fretting in Mg-Al increases monotonously with the increase of the relative humidity, but in samples without electric current there is a transition giving a maximum at about 50%RH. These results make it clear that the wear behavior is subject to the electrical contact condition in each alloy. On the basis of the experimental results, the effects of Mg (or Al) as an Al (or Mg) additive on the electrical contact property are discussed
  • Keywords
    X-ray diffraction; aluminium alloys; contact resistance; electrical contacts; magnesium alloys; wear; Al-Mg; Al-Mg alloys; X-ray diffraction; contact resistance; electric current; electrical contact resistors; relative humidity; surface fretting; wear; Additives; Aluminum; Chemical elements; Conducting materials; Contact resistance; Current; Humidity; Resistors; Shape memory alloys; Surface resistance;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.486568
  • Filename
    486568