DocumentCode :
769152
Title :
The radiation of a rectangular power-bus structure at multiple cavity-mode resonances
Author :
Leone, Marco
Author_Institution :
Siemens AG, Erlangen, Germany
Volume :
45
Issue :
3
fYear :
2003
Firstpage :
486
Lastpage :
492
Abstract :
The radiation from power-bus structures on high-speed printed circuit boards due to the switching noise current of digital integrated circuits is investigated. The study is based on an analytical cavity-resonator model for a rectangular parallel-plate structure. Based on the application of the field-equivalence principle, the radiated field is calculated from the electric edge-field distribution. For typical board dimensions, several cavity-mode resonances occur within the typical frequency range of interest, leading to relatively high maximum values for radiated emission. The evaluation of the radiation patterns reveals that all (0, nth) resonances have equal maximum amplitudes in the whole mode spectrum. This allows the setting up of an engineering equation for quantifying the noise-current-related maximum radiated field strength, including the dielectric and ohmic loss. Among all geometrical and material parameters, the dielectric thickness is one of the most effective ones to control radiated emission. The theoretical results are well confirmed by accurate measurements carried out in an anechoic room.
Keywords :
cavity resonators; dielectric losses; electromagnetic interference; field strength measurement; microstrip antennas; printed circuits; analytical cavity-resonator model; anechoic room; board dimensions; cavity/patch-antenna model; dielectric loss; dielectric thickness; digital integrated circuits; electric edge-field distribution; engineering equation; field-equivalence principle; geometrical parameters; high-speed printed circuit boards; material parameters; multiple cavity-mode resonances; ohmic loss; radiated emission control; radiated field strength; radiation patterns; rectangular parallel-plate structure; rectangular power-bus structure radiation; switching noise current; Analytical models; Dielectric losses; Dielectric materials; Digital integrated circuits; Equations; Frequency; Integrated circuit noise; Printed circuits; Resonance; Switching circuits;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2003.815560
Filename :
1223617
Link To Document :
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