DocumentCode :
769159
Title :
A novel systematic approach for equivalent model extraction of embedded high-speed interconnects in time domain
Author :
Wu, Tzong-Lin ; Kuo, Chun-Chih ; Chang, Hsiao-Chen ; Hsieh, Jian-Sheng
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
Volume :
45
Issue :
3
fYear :
2003
Firstpage :
493
Lastpage :
501
Abstract :
Based on time-domain scattered data, an efficient systematic approach in the time domain has been proposed to extract the SPICE-compatible models of embedded high-speed interconnects. The approach combines the layer-peeling technique and the generalized pencil-of-matrix method to obtain a pole-residue representation of the step response of the interconnects. An order-reduction procedure is implemented based on the bandwidth criterion to find the optimum pole-residue representation of the interconnects with minimum pole numbers. The SPICE-compatible lumped circuits are then systematically extracted from the pole-residue rational functions. The discontinuous microstrip lines and bonding wire structure are used to demonstrate the validity of the proposed approach. Good agreement is seen between the modeled and measured transient response. The advantages of this approach are the de-embedding ability for arbitrary nonuniform interconnects, systematically obtaining lower order and more accurate SPICE-compatible circuits, and broad-band performance of the extracted circuits.
Keywords :
SPICE; circuit analysis computing; circuit simulation; equivalent circuits; finite difference time-domain analysis; interconnections; lumped parameter networks; matrix algebra; microstrip lines; poles and zeros; printed circuits; transient response; wires (electric); FDTD simulation; SPICE-compatible lumped circuits; SPICE-compatible models; bandwidth criterion; bonding wire structure; broad-band performance; discontinuous microstrip lines; embedded high-speed interconnects; equivalent model extraction; generalized pencil-of-matrix method; layer-peeling technique; measured transient response; modeled transient response; nonuniform interconnects; optimum pole-residue representation; order-reduction procedure; pole-residue rational functions; step response; time-domain scattered data; Bonding; Circuit simulation; Computational modeling; Data mining; Equivalent circuits; Frequency; High speed integrated circuits; Integrated circuit interconnections; Power system transients; Wire;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2003.815526
Filename :
1223618
Link To Document :
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