DocumentCode :
769254
Title :
Use of a flat-panel detector for microtomography: a feasibility study for small-animal imaging
Author :
Kim, Ho Kyung ; Lee, Sang Chul ; Cho, Min Hyoung ; Lee, Soo Yeol ; Cho, Gyuseong
Author_Institution :
Sch. of Mech. Eng., Pusan Nat. Univ., South Korea
Volume :
52
Issue :
1
fYear :
2005
Firstpage :
193
Lastpage :
198
Abstract :
We have applied a flat-panel detector to an X-ray cone-beam micro computed tomography (micro-CT) for small-animal imaging. The flat-panel detector consists of an active matrix of transistors and photodiodes with a pixel pitch of 50 μm and a thallium-doped cesium iodide (CsI:Tl) scintillator as an X-ray-to-light conversion layer. The detector was fabricated with a complementary metal-oxide-semiconductor (CMOS) technology capable of a submicrometer design line width, hence, it has a pixel fill-factor as high as ∼80%. In addition, the detector has a very fast response characteristic with an image lag less than 0.3% in the frame integration time of 5 s. The CMOS flat-panel detector has been tested in terms of modulation transfer function, noise power spectrum, and detective quantum efficiency. Tomographic imaging performances of the micro-CT system, such as voxel noise, contrast-to-noise ratio, and spatial resolution, have also been evaluated by using various quantitative phantoms. Experimental results of euthanized laboratory rat imaging suggest that the micro-CT system employing a CMOS flat-panel detector can be greatly used in small-animal imaging.
Keywords :
X-ray imaging; biomedical imaging; computerised tomography; phantoms; photodiodes; scintillation counters; semiconductor counters; X-ray cone-beam microcomputed tomography; X-ray-to-light conversion layer; complementary metal-oxide-semiconductor technology; contrast-to-noise ratio; detective quantum efficiency; flat-panel detector; microtomography; modulation transfer function; noise power spectrum; photodiodes; pixel fill-factor; pixel pitch; small-animal imaging; spatial resolution; submicrometer design line width; thallium-doped cesium iodide scintillator; tomographic imaging performance; voxel noise; Active matrix technology; CMOS technology; Computed tomography; Image converters; Optical imaging; Photodiodes; Testing; X-ray detection; X-ray detectors; X-ray imaging; Flat-panel detector; microtomography; small-animal imaging;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2004.843107
Filename :
1417129
Link To Document :
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