DocumentCode
769353
Title
Analysis of order-statistic CFAR threshold estimators for improved ultrasonic flaw detection
Author
Saniie, Jafar ; Nagle, Daniel T.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Volume
39
Issue
5
fYear
1992
Firstpage
618
Lastpage
630
Abstract
In the pulse-echo method using broadband transducers, flaw detection can be improved by using optimal bandpass filtering to resolve flaw echoes surrounded by grain scatterers. Optimal bandpass filtering is achieved by examining spectral information of the flaw and grain echoes where frequency differences have been experimentally shown to be predictable in the Rayleigh scattering region. Using optimal frequency band information, flaw echoes can then be discriminated by applying adaptive thresholding techniques based on surrounding range cells. The authors present order-statistic (OS) processors, ranked and trimmed mean (TM), to robustly estimate the threshold while censoring outliers. The design of these OS processors is accomplished analytically based on constant false-alarm rate (CFAR) detection. It is shown that OS-CFAR and TM-CFAR processors can detect flaw echoes robustly with the CFAR of 10/sup -4/ where the range cell used for the threshold estimate contains outliers.<>
Keywords
acoustic filters; acoustic signal processing; band-pass filters; flaw detection; ultrasonic materials testing; OS processors; OS-CFAR processor; Rayleigh scattering region; TM-CFAR processors; adaptive thresholding techniques; broadband transducers; constant false alarm rate detection; grain echoes; material microstructure; optimal bandpass filtering; optimal frequency band; order-statistic CFAR threshold estimators; pulse-echo method; ultrasonic flaw detection; Adaptive signal detection; Band pass filters; Detectors; Filtering; Frequency estimation; Microstructure; Rayleigh scattering; Robustness; Senior members; Statistical analysis;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.156180
Filename
156180
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