• DocumentCode
    769353
  • Title

    Analysis of order-statistic CFAR threshold estimators for improved ultrasonic flaw detection

  • Author

    Saniie, Jafar ; Nagle, Daniel T.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • Volume
    39
  • Issue
    5
  • fYear
    1992
  • Firstpage
    618
  • Lastpage
    630
  • Abstract
    In the pulse-echo method using broadband transducers, flaw detection can be improved by using optimal bandpass filtering to resolve flaw echoes surrounded by grain scatterers. Optimal bandpass filtering is achieved by examining spectral information of the flaw and grain echoes where frequency differences have been experimentally shown to be predictable in the Rayleigh scattering region. Using optimal frequency band information, flaw echoes can then be discriminated by applying adaptive thresholding techniques based on surrounding range cells. The authors present order-statistic (OS) processors, ranked and trimmed mean (TM), to robustly estimate the threshold while censoring outliers. The design of these OS processors is accomplished analytically based on constant false-alarm rate (CFAR) detection. It is shown that OS-CFAR and TM-CFAR processors can detect flaw echoes robustly with the CFAR of 10/sup -4/ where the range cell used for the threshold estimate contains outliers.<>
  • Keywords
    acoustic filters; acoustic signal processing; band-pass filters; flaw detection; ultrasonic materials testing; OS processors; OS-CFAR processor; Rayleigh scattering region; TM-CFAR processors; adaptive thresholding techniques; broadband transducers; constant false alarm rate detection; grain echoes; material microstructure; optimal bandpass filtering; optimal frequency band; order-statistic CFAR threshold estimators; pulse-echo method; ultrasonic flaw detection; Adaptive signal detection; Band pass filters; Detectors; Filtering; Frequency estimation; Microstructure; Rayleigh scattering; Robustness; Senior members; Statistical analysis;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.156180
  • Filename
    156180