Title :
Modeling of spatially periodic dielectric sensors in the presence of a top ground plane bounding the test dielectric
Author :
Sheiretov, Y. ; Zahn, M.
Keywords :
Dielectric losses; Dielectric materials; Dielectric measurements; Distortion measurement; Equations; Permittivity measurement; Printing; Testing; Thickness measurement; USA Councils;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2005.1561810
