Title : 
Automated photocurrent and bussing extraction for dose-rate rail span collapse simulations
         
        
            Author : 
Bhuva, B. ; Mehrotra, S. ; Massengill, L. ; Kerns, S.
         
        
            Author_Institution : 
Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
         
        
        
        
        
            fDate : 
12/1/1990 12:00:00 AM
         
        
        
        
            Abstract : 
A simulator capable of simulating rail span collapse from layout-level inputs was developed. The simulations require radiation-induced photocurrent partitioning among proximal physical collection regions and electrical contacts to the power distribution network. The simulation approach incorporates simple geometric rules for current division inside a contiguous region along with the automated extraction of the power distribution network. Experimental results to verify the current division algorithms are also presented. Pixel-plane and scan-line techniques used for the automated extraction of the power distribution network are described. For simulation of the circuit, a simulator using conjugate-gradient algorithms is used. A postsimulation processor maps the actual supply rails onto the layout itself for easy identification of critical subcircuits
         
        
            Keywords : 
VLSI; digital simulation; radiation hardening (electronics); VLSI; automated bussing extraction; automated extraction; automated photocurrent extraction; conjugate-gradient algorithms; current division algorithms; dose-rate rail span collapse simulations; electrical contacts; geometric rules for current division; identification of critical subcircuits; layout-level inputs; pixel plane techniques; postsimulation processor; power distribution network; proximal physical collection regions; radiation-induced photocurrent partitioning; scan-line techniques; Circuit simulation; Combinational circuits; Computational modeling; Computer simulation; Photoconductivity; Power systems; Predictive models; Rails; Shape; Voltage;
         
        
        
            Journal_Title : 
Nuclear Science, IEEE Transactions on