DocumentCode :
769501
Title :
Automated photocurrent and bussing extraction for dose-rate rail span collapse simulations
Author :
Bhuva, B. ; Mehrotra, S. ; Massengill, L. ; Kerns, S.
Author_Institution :
Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
Volume :
37
Issue :
6
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
2104
Lastpage :
2109
Abstract :
A simulator capable of simulating rail span collapse from layout-level inputs was developed. The simulations require radiation-induced photocurrent partitioning among proximal physical collection regions and electrical contacts to the power distribution network. The simulation approach incorporates simple geometric rules for current division inside a contiguous region along with the automated extraction of the power distribution network. Experimental results to verify the current division algorithms are also presented. Pixel-plane and scan-line techniques used for the automated extraction of the power distribution network are described. For simulation of the circuit, a simulator using conjugate-gradient algorithms is used. A postsimulation processor maps the actual supply rails onto the layout itself for easy identification of critical subcircuits
Keywords :
VLSI; digital simulation; radiation hardening (electronics); VLSI; automated bussing extraction; automated extraction; automated photocurrent extraction; conjugate-gradient algorithms; current division algorithms; dose-rate rail span collapse simulations; electrical contacts; geometric rules for current division; identification of critical subcircuits; layout-level inputs; pixel plane techniques; postsimulation processor; power distribution network; proximal physical collection regions; radiation-induced photocurrent partitioning; scan-line techniques; Circuit simulation; Combinational circuits; Computational modeling; Computer simulation; Photoconductivity; Power systems; Predictive models; Rails; Shape; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.101236
Filename :
101236
Link To Document :
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