Title :
Validity of using a fixed analog input for evaluating the SEU sensitivity of a flash analog-to-digital converter
Author :
Buchner, Stephen ; Campbell, Arthur B. ; Sternberg, Andrew ; Massengill, Lloyd ; McMorrow, Dale ; Dyer, Clive
Author_Institution :
QSS Group Inc., Greenbelt, MD, USA
Abstract :
The single-event upset (SEU) rate in a flash analog-to-digital converter (ADC) AD9058 on board a space experiment varied by more than an order of magnitude, depending on the input. A pulsed laser aided in elucidating the reasons, which were found to be the result of the unique design of the AD9058.
Keywords :
analogue-digital conversion; space research; space vehicles; AD9058 design; SEU sensitivity; decoding security; fixed analog input; flash analog-to-digital converter; pulsed laser; single-event upset rate; space experiment; space radiation; spacecraft electrical system; Analog-digital conversion; Decoding; Extraterrestrial measurements; Optical design; Optical pulses; Performance evaluation; Security; Single event upset; Testing; Voltage; Analog-to-digital converter (ADC); decoding security; single-event upsets (SEUs); space radiation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.842721
