• DocumentCode
    770282
  • Title

    Lacunarity of fractal superlattices: a remote estimation using wavelets

  • Author

    Laksari, Y. ; Aubert, H. ; Jaggard, D.L. ; Tourneret, J.Y.

  • Author_Institution
    Ecole Nat. Superieure d´´Electronique, Inst. Nat. Polytechnique, Toulouse, France
  • Volume
    53
  • Issue
    4
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    1358
  • Lastpage
    1363
  • Abstract
    The lacunarity provides a useful parameter for describing the distribution of gap sizes in discrete self-similar (fractal) superlattices and is used in addition to the similarity dimension to describe fractals. We show here that lacunarity, as well as the similarity dimension, can be remotely estimated from the wavelet analysis of superlattices impulse response. As a matter of fact, the skeleton - the set of wavelet-transform modulus-maxima - of the reflected signal overlaps two hierarchical structures in the time-scale domain: such that one allows the direct remote extraction of the similarity dimension, while the other may provide an accurate estimation of the lacunarity of the interrogated superlattice. Criteria for the choice of the mother wavelet are established for impulse response corrupted by additive Gaussian white noise.
  • Keywords
    AWGN; discrete wavelet transforms; electromagnetic wave reflection; fractals; inverse problems; superlattices; transient response; additive Gaussian white noise; direct remote extraction; discrete self-similar superlattice; impulse response; interrogated fractal superlattice; inverse problem; lacunarity; remote estimation; signal overlap reflection; time-scale domain; wavelet-transform modulus-maxima; Acoustic reflection; Additive white noise; Discrete wavelet transforms; Fractals; Inverse problems; Refractive index; Superlattices; Wavelet analysis; Wavelet domain; White noise; Inverse problem; lacunarity; noise; wavelet analysis;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2005.844434
  • Filename
    1417215