Advances in the development of encapsulants for mercuric iodide X-ray detectors

Author

Iwanczyk, J.S. ; Wang, Y.J. ; Bradley, J.G. ; Albee, A.L. ; Schnepple, W.F.

Author_Institution

Xsirus Inc., Marina del Ray, CA, USA

Volume

37

Issue

6

fYear

1990

fDate

12/1/1990 12:00:00 AM

Firstpage

2214

Lastpage

2218

Abstract

Advances in the development of protective impermeable encapsulants with high transparency to ultra-low-energy X-rays for use on HgI₂ X-ray detectors are reported. Various X-ray fluorescence spectra from coated detectors are presented. The X-ray absorption in the encapsulants has been analyzed using characteristic radiation from various elements. Results suggest that low-energy cutoffs for the detectors are not determined solely by the encapsulating coatings presently employed but are also influenced by the front electrode and surface effects, which can affect the local electric field or the surface recombination velocity. An energy resolution of 182 eV (FWHM) has been achieved for Ni L lines at 850 eV. Improved detector sensitivity to X-ray energies under 700 eV is demonstrated

Keywords

X-ray emission spectra; X-ray fluorescence analysis; lithium; semiconductor counters; 182 eV; 700 eV; HgI₂; HgI₂ X-ray detectors; L lines; Ni; X-ray absorption; X-ray fluorescence spectra; encapsulants; energy resolution; front electrode; high transparency; sensitivity; surface effects; surface recombination velocity; ultra-low-energy X-rays; Attenuation; Coatings; Electrodes; Electromagnetic wave absorption; Encapsulation; Fluorescence; Marine technology; Protection; X-ray detection; X-ray detectors;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.101259

Filename

101259