• DocumentCode
    770474
  • Title

    A New Poly-Si TFT Current-Mirror Pixel for Active Matrix Organic Light Emitting Diode

  • Author

    Lee, Jae-Hoon ; Nam, Woo-Jin ; Kim, Byeong-Koo ; Choi, Hong-Seok ; Ha, Yong-Min ; Han, Min-Koo

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ.
  • Volume
    27
  • Issue
    10
  • fYear
    2006
  • Firstpage
    830
  • Lastpage
    833
  • Abstract
    A new poly-Si thin-film-transistor (TFT) current-mirror-active-matrix-organic-light-emitting-diode (AMOLED) pixel, which successfully compensates for the variation of the threshold voltage as well as mobility in the excimer laser annealed poly-Si TFT pixel, is designed and fabricated. The OLED current (IOLED) of the proposed pixel does not depend on the operating temperature. When the temperature of pixel is increased from 27 degC to 60 degC, the I OLED of the new pixel circuit composed of four TFTs and one capacitor increases only about 1.5%, while that of a conventional pixel composed of two TFTs and one capacitor increases about 37%. At room temperature, nonuniformity of the IOLED in the proposed circuit was also considerably suppressed at around 9%. We have successfully fabricated a 1.2-in AMOLED panel (96times96timesred green blue) to evaluate the performance of the proposed pixel. A troublesome residual image caused by the hysteresis phenomenon of the poly-Si TFT was almost eliminated in the proposed AMOLED panel as a result of current programming
  • Keywords
    annealing; organic light emitting diodes; silicon; thin film transistors; 27 to 60 C; active matrix organic light emitting diode; current programming; current-mirror pixel; excimer lasers; hysteresis phenomenon; residual image; thin film transistor; Active matrix organic light emitting diodes; Annealing; Capacitors; Circuits; Hysteresis; Optical design; Organic light emitting diodes; Temperature dependence; Thin film transistors; Threshold voltage; Data-current scaling; pixel circuit; poly-Si thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2006.883056
  • Filename
    1704914