DocumentCode :
770677
Title :
Process of Magnetization Reversal in a Spot Heated by Pulsed Laser Beam
Author :
Oda, H. ; Ono, T. ; Matsushima, M.
Author_Institution :
Canon Inc.
Volume :
2
Issue :
8
fYear :
1987
Firstpage :
704
Lastpage :
709
Abstract :
The process of magnetization reversal in a bit written by a light beam was observed using a micro-Kerr effect measurement technique. Pulsed laser light (of wave-length 830 nm), combined with a synchronized, sinusoidally oscillating bias magnetic field, caused repeated writing and erasing of a bit. By monitoring cw laser light (633 nm) focused on the bit, the change in the Rerr rotation angle due to the rise in temperature was measured. Samples used were amorphous rare-earth--transition-metal (RE-TM) thin films (TbFeCo) sputtered onto glass substrates. For TM-rich films, domains in spots irradiated by laser light in a zero bias magnetic field tend to include magnetic reversal regions; for RE-rich films, in contrast, there is a single stable domain.
Keywords :
Laser beams; Laser transitions; Magnetic field measurement; Magnetic films; Magnetization reversal; Measurement techniques; Monitoring; Optical pulses; Temperature measurement; Writing;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1987.4549582
Filename :
4549582
Link To Document :
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