DocumentCode
770709
Title
Noncoherent sequential acquisition of PN sequences for DS/SS communications with/without channel fading
Author
Tantaratana, S. ; Lam, A.W. ; Vincent, P.J.
Author_Institution
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Volume
43
Issue
38020
fYear
1995
Firstpage
1738
Lastpage
1745
Abstract
Studies sequential acquisition schemes of m-sequences, based on the sequential probability ratio test (SPRT) and a truncated SPRT (TSPRT), with noncoherent demodulation. Most reported results on sequential acquisition schemes assume that independent samples are available for the decision process. The assumption of independent and identically distributed (i.i.d.) samples requires the integrator in the receiver to be reset periodically. This introduces loss in the effective signal-to-noise ratio, degrading the performance. In the present paper, on the contrary, the authors´ two sequential schemes use continuous integration. It can be shown that the likelihood ratio is monotonic; consequently, the tests can be easily implemented in realtime. Methods are proposed for designing the decision thresholds to achieve the desired false-alarm and miss probabilities. Performances of the proposed schemes are obtained and they suggest that the TSPRT is more desirable. The effect of slowly-varying channel fading is also investigated. Results show that fading does not affect the false alarm probabilities, but it can drastically reduce the probability of detecting the alignment of the two PN sequences, especially when the fading is severe.<>
Keywords
demodulation; fading; pseudonoise codes; signal detection; spread spectrum communication; time-varying channels; DS/SS communications; PN sequences; TSPRT; channel fading; decision thresholds; false alarm probabilities; independent and identically distributed samples; likelihood ratio; m-sequences; miss probabilities; noncoherent demodulation; noncoherent sequential acquisition; performance; sequential acquisition schemes; sequential probability ratio test; signal-to-noise ratio; slowly-varying channel fading; truncated SPRT; Degradation; Demodulation; Fading; Performance loss; Sequential analysis; Signal to noise ratio; Testing;
fLanguage
English
Journal_Title
Communications, IEEE Transactions on
Publisher
ieee
ISSN
0090-6778
Type
jour
DOI
10.1109/26.380224
Filename
380224
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