An analytical model for the aliasing probability in signature analysis testing

Author

Damiani, Maurizio ; Olivo, Piero ; Favalli, Michele ; Ricco, Bruno

Author_Institution

DEIS, Bologna Univ., Italy

Volume

8

Issue

11

fYear

1989

fDate

11/1/1989 12:00:00 AM

Firstpage

1133

Lastpage

1144

Abstract

The Markov chain model of linear feedback shift-registers (LFSRs) for signature analysis testing is analytically solved to obtain the exact expression of the aliasing error probability as a function of test length, error probability, and the structure of the feedback network. The dependence on feedback configuration is explored in depth, and it is proven that maximum-length LFSRs have the best performances with respect to aliasing, regardless of the particular structure of their feedback network. Simplified expressions of aliasing probability are also derived for use as practical tools to design LFSRs for IC signature analysis testing, and a heuristic criterion is given for the identification of peaks in aliasing probability

Keywords

Markov processes; VLSI; automatic testing; error statistics; integrated circuit testing; logic testing; probability; shift registers; IC testing; Markov chain model; VLSI; aliasing probability; analytical model; error probability; feedback configuration; heuristic criterion; linear feedback shift-registers; peaks identification; signature analysis testing; test length; Analytical models; Built-in self-test; Circuit faults; Circuit testing; Error probability; Feedback; Integrated circuit testing; Polynomials; Shift registers; Very large scale integration;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.41499

Filename

41499