Title :
An analytical model for the aliasing probability in signature analysis testing
Author :
Damiani, Maurizio ; Olivo, Piero ; Favalli, Michele ; Ricco, Bruno
Author_Institution :
DEIS, Bologna Univ., Italy
fDate :
11/1/1989 12:00:00 AM
Abstract :
The Markov chain model of linear feedback shift-registers (LFSRs) for signature analysis testing is analytically solved to obtain the exact expression of the aliasing error probability as a function of test length, error probability, and the structure of the feedback network. The dependence on feedback configuration is explored in depth, and it is proven that maximum-length LFSRs have the best performances with respect to aliasing, regardless of the particular structure of their feedback network. Simplified expressions of aliasing probability are also derived for use as practical tools to design LFSRs for IC signature analysis testing, and a heuristic criterion is given for the identification of peaks in aliasing probability
Keywords :
Markov processes; VLSI; automatic testing; error statistics; integrated circuit testing; logic testing; probability; shift registers; IC testing; Markov chain model; VLSI; aliasing probability; analytical model; error probability; feedback configuration; heuristic criterion; linear feedback shift-registers; peaks identification; signature analysis testing; test length; Analytical models; Built-in self-test; Circuit faults; Circuit testing; Error probability; Feedback; Integrated circuit testing; Polynomials; Shift registers; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
