• DocumentCode
    771074
  • Title

    Knowledge-based functional specification of test and maintenance programs

  • Author

    Robach, Chantal ; Lutoff, Daniel ; Garcia, Nouar

  • Author_Institution
    Lab. de Genie Inf.-IMAG, Grenoble, France
  • Volume
    8
  • Issue
    11
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    1145
  • Lastpage
    1156
  • Abstract
    An expert system prototype is presented whose aim is to select a test strategy for complex devices, logic PC boards, or systems. Given a set of resources on the board and a set of functions which are performed using these (or a subset of these) resources, the expert system produces a sequence of functions through which the board should be tested. The sequence should be among the best according to a set of criteria (testability, complexity) and subject to constraints (testability threshold, priority). The obtained sequence can be used for developing functional tests. A minimum set of rules is defined as well as default evaluation functions in order to simulate the strategy´s evolution. This prototype allows verification of the method validity on various examples. The expert system, written in OPS5 language, runs on VAX. It is made up of 350 production rules, of which 250 concern the strategy tree exploration and 100 are related to the type-1 and type-3 knowledge
  • Keywords
    VLSI; automatic testing; electronic engineering computing; expert systems; integrated circuit testing; logic testing; IC testing; OPS5 language; VAX; VLSI circuit testing; complex devices; default evaluation functions; expert system prototype; functional tests; knowledge based functional specification; logic PC boards; maintenance programs; strategy tree exploration; test strategy selection; Circuit faults; Circuit testing; Diagnostic expert systems; Hardware; Life testing; Logic testing; Manufacturing; Performance evaluation; System testing; Test pattern generators;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.41500
  • Filename
    41500