• DocumentCode
    771144
  • Title

    Advances in Semiconductor Detectors for Charged Particle Space Spectrometry

  • Author

    Friedland, S.S. ; Katzenstein, H.S. ; Ziemba, F.P.

  • Author_Institution
    Solid State Radiations, Inc. Los Angeles, California
  • Volume
    10
  • Issue
    1
  • fYear
    1963
  • Firstpage
    190
  • Lastpage
    201
  • Abstract
    Nuclear semiconductor detectors have been limited in their dynamic range of linearity of pulse height versus energy for charged particle spectrometry because of (1) the depth of the sensitive volume, (2) the thickness of any entrance window, and (3) the noise level of the detector-amplifier system. Consideration has been given to extend the range of sensitivity by increasing the volume of the detector by lithium ion drift compensation and to increase the sensitivity to lower energies by removing any entrance window and reducing the noise level of the detector and the amplifier.
  • Keywords
    Leak detection; Leakage current; Noise level; Radiation detectors; Semiconductor device noise; Semiconductor diodes; Semiconductor radiation detectors; Space charge; Spectroscopy; Surface resistance;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1963.4323261
  • Filename
    4323261