DocumentCode
771144
Title
Advances in Semiconductor Detectors for Charged Particle Space Spectrometry
Author
Friedland, S.S. ; Katzenstein, H.S. ; Ziemba, F.P.
Author_Institution
Solid State Radiations, Inc. Los Angeles, California
Volume
10
Issue
1
fYear
1963
Firstpage
190
Lastpage
201
Abstract
Nuclear semiconductor detectors have been limited in their dynamic range of linearity of pulse height versus energy for charged particle spectrometry because of (1) the depth of the sensitive volume, (2) the thickness of any entrance window, and (3) the noise level of the detector-amplifier system. Consideration has been given to extend the range of sensitivity by increasing the volume of the detector by lithium ion drift compensation and to increase the sensitivity to lower energies by removing any entrance window and reducing the noise level of the detector and the amplifier.
Keywords
Leak detection; Leakage current; Noise level; Radiation detectors; Semiconductor device noise; Semiconductor diodes; Semiconductor radiation detectors; Space charge; Spectroscopy; Surface resistance;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1963.4323261
Filename
4323261
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