DocumentCode :
771150
Title :
Numerical simulations of the reditron
Author :
Kwan, Thomas J T ; Davis, Harold A.
Author_Institution :
Los Alamos Nat. Lab., NM, USA
Volume :
16
Issue :
2
fYear :
1988
fDate :
4/1/1988 12:00:00 AM
Firstpage :
185
Lastpage :
191
Abstract :
The reflected-electrons discrimination microwave generator (reditron) is a high-power, narrow-band, and single-mode microwave generator that makes exclusive use of the oscillatory character of the virtual-cathode of a relativistic electron beam. The complex, nonlinear character of the virtual-cathode device necessitates particle-in-cell plasma simulation techniques. Investigations indicate two sources of the radiation: (1) the trapped electrons reflexing between the real and virtual cathodes, and (2) the oscillation of the virtual cathode. In the conventional design, the two mechanisms coexist and interfere with each other destructively, causing degradation of the efficiency of microwave generation. The authors have investigated a configuration with a slotted, thick anode and an external magnetic field, which effectively eliminates the reflexing electrons. Two-dimensional particle-in-cell simulations showed that such a configuration exploits the oscillation of the virtual cathode exclusively, and it generates single-mode, narrow bandwidth, and high-power microwave radiation with a potential efficiency over 10%. It was found that further optimization could be achieved by the use of a density (current) modulated electron beam at appropriate frequencies
Keywords :
microwave generation; microwave oscillators; relativistic electron beam tubes; external magnetic field; oscillation; particle-in-cell plasma simulation techniques; reditron; reflected-electrons discrimination microwave generator; reflexing electrons; relativistic electron beam; slotted, thick anode; virtual-cathode; Cathodes; Character generation; Electron beams; Electron traps; High power microwave generation; Microwave devices; Microwave generation; Narrowband; Numerical simulation; Plasma simulation;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.3813
Filename :
3813
Link To Document :
بازگشت