DocumentCode :
771151
Title :
Evaluation and Vacuum Stability Tests of Silicon Radiation Detectors
Author :
Weiss, W.L.
Author_Institution :
Oak Ridge Technical Enterprises Corporation Oak Ridge, Tennessee
Volume :
10
Issue :
1
fYear :
1963
Firstpage :
202
Lastpage :
210
Abstract :
Tests have been carried out on a group of commercially available silicon radiation detectors of both diffused junction and surface barrier types. Measurements were made of reverse current and RMS noise level as a function of applied bias voltage in air and vacuum, alpha particle pulse height and energy resolution, and thickness of the sensitive surface dead layer. Long term stability was evaluated for samples in air and in vacuum by periodic measurements of reverse current, RMS noise voltage, and the pulse height and energy resolution for 5.8 Mev alpha particles. The samples in the vacuum tests were maintained at rated bias voltage and a pressure of approximately 10-6 Torr continuously for a period of six months. Only minor changes were observed in the performance characteristics of the devices. This work was sponsored by the Aeronautical Research Laboratory of Wright-Patterson Air Force Base, Office of Aerospace Research, United States Air Force.
Keywords :
Current measurement; Elementary particle vacuum; Energy measurement; Noise measurement; Particle measurements; Pulse measurements; Silicon radiation detectors; Stability; Testing; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1963.4323262
Filename :
4323262
Link To Document :
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