DocumentCode
771457
Title
Iron-Oxygen Based Perpendicular Anisotropy Thin Films (Part 1)
Author
Akutsu, N. ; Akimitsu, M. ; Mizoguchi, T.
Author_Institution
Research Development Corporation of Japan
Volume
2
Issue
11
fYear
1987
Firstpage
1001
Lastpage
1002
Abstract
The magnetostatic properties of sputtered Fex O100-x films with Si or Co added are reported. Si or Co acts to extend the range of perpendicular magnetization to regions of higher magnetization. In the Fex O100-x system, a point of zero magnetization exists near x = 49%; this is abruptly shifted to lower Fe concentrations with the addition of Si. The observed dependence of magnetization on composition agrees with calculations which assume that silicon combines to form SiO2 and the remaining oxygen forms FeO.
Keywords
Anisotropic magnetoresistance; Iron; Magnetic anisotropy; Magnetic films; Magnetic properties; Magnetization; Magnetostatics; Perpendicular magnetic anisotropy; Sputtering; Transistors;
fLanguage
English
Journal_Title
Magnetics in Japan, IEEE Translation Journal on
Publisher
ieee
ISSN
0882-4959
Type
jour
DOI
10.1109/TJMJ.1987.4549664
Filename
4549664
Link To Document