Accurate modeling of line-defect photonic crystal waveguides

Author

Sauvan, C. ; Lalanne, P. ; Rodier, J.C. ; Hugonin, J.P. ; Talneau, A.

Author_Institution

Centre Nat. de la Recherche Scientifique, Univ. Paris Sud, Orsay, France

Volume

15

Issue

9

fYear

2003

Firstpage

1243

Lastpage

1245

Abstract

An accurate three-dimensional method to calculate the Bloch modes of photonic crystal (PhC) waveguides is proposed. Good agreement with available experimental and numerical data is obtained. The originality of the method lies in the fact that the Bloch modes are seen as the electromagnetic fields associated to the complex poles of an in-plane transversal scattering matrix. In comparison with previous approaches, the computational domain discretized is smaller and a higher accuracy for the losses of PhC waveguides is achieved.

Keywords

electromagnetic field theory; light scattering; matrix algebra; optical losses; optical waveguide theory; photonic crystals; Bloch modes; accuracy; computational domain; electromagnetic fields; in-plane transversal scattering matrix; integrated optics; line-defect photonic crystal waveguides; photonic crystal waveguides; three-dimensional method; Electromagnetic waveguides; Etching; Optical attenuators; Optical computing; Optical losses; Optical scattering; Optical waveguides; Optical wavelength conversion; Photonic crystals; Transmission line matrix methods;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2003.816123

Filename

1224593