Title :
The Byzantine hardware fault model
Author :
Nanya, Takashi ; Goosen, Hendrik A.
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
fDate :
11/1/1989 12:00:00 AM
Abstract :
A new fault model for temporary failures is presented. This model is motivated and supported by recent experimental studies on types of temporary failures which cannot be explained by existing models. This new fault is called a Byzantine fault by analogy with the well-known Byzantine Generals problem in distributed systems. An example of an important type of Byzantine fault called a short transient is analyzed. The effects of Byzantine faults on concurrent error checking circuits are discussed. Design techniques to eliminate the effects of Byzantine faults are presented
Keywords :
digital circuits; error correction; error detection; failure analysis; fault tolerant computing; logic design; logic testing; system recovery; transients; Byzantine hardware fault model; concurrent error checking circuits; logic design techniques; short transient; temporary failures; Application software; Circuit analysis; Circuit faults; Circuit testing; Computer errors; Councils; Defense industry; Hardware; System testing; Transient analysis;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
